简介:Itisimpossibletodirectlyanalyzethemicrostructureofspin-valvemultilayersbasedonNi,F,CuandMnbyaconventionalX-raydiffractiontechniquebecausethelatticeparameterandatomicsatteringfactorsofthemareveryclose.Tosolvethisproblem,weuseanx-rayanomalousdiffractiontechniquetocharacterizethemicrostructuresofthe[Ni80Fe20/Fe50Mn50]15and[Ni80Fe20/Cu]15superlatticesystems.Theresultsshowthatmorediffractionpeaksandhigherinternsityinthereflectivetyprofileareobservedwhentheincidentenergyisclosetotheabsorptionedgeofthelighterelement(Mn)in[Ni80Fe20/Fe50Mn50]15multilayersystemsandtotheabsorptionedgeoftheheavierelement(Cu)inthe[Ni80Fe20/Cu]15multilayersystems.Theinterfaceandperiodicstructureof[Ni80F20/Fe50Mn50]15aremoreperfectthanthatofthe[Ni80Fe20/Cu]15superlattices.Theaboveresultsaredisussedinthispaper.
简介:Small-angleX-rayscattering(SAXS)usingsynchrotronradiationasX-raysourcehasbeenemployedtocharactcizcthemicroscopicstructrureoforgano-modifiedmesoporousmolecularsieves(organo-MSU-X)preparedbyaone-pottemplate-directedsynthesis.ItisshownthattheSAXSprofileishardlyconstantwithPorod’slawshowinganegativeslope,i.e.,negativedeviation.Thissuggeststhatthereisdiffuseinterfaciallayerlocatedbetweentheporesandthematrix.Thissuggeststhattheorganicgroupsremaincovalentlylinkedtothematrix,asindicatedby^29SiCPMASNMRandFT-IR.Theaveragethicknessoftheinterfaciallayerwasfoundtobeabout1nmforeachofthethreesampleswithdifferentkindsandthesameamounts(20?oforganicgroups.Thiskindofmaterialhasalsobeenprovedtopossessbothsurfaceandmassfractalstructureoftheamophousporoussilicamaterials.2001ElsevierScienceB.V.Allrightsreserved.
简介:ThispaperprovidesareviewonsampleinjectorswhichareprovidedatSPring-8AngstromCompactfreeelectronLAser(SACLA)forconductingserialmeasurementina‘diffract-before-destroy'schemeusinganx-rayfreeelectronlaser(XFEL).VersatileexperimentalplatformsatSACLAareabletoacceptvarioustypesofinjectors,amongwhichliquidjet,dropletandviscouscarrierinjectorsarefrequentlyutilized.Theseinjectorsproducedifferentformsoffluidtargetssuchasaliquidfilamentwithadiameterintheorderofmicrometer,micro-dropletsynchronizedtoXFELpulses,andslowlyflowingcolumnofhighlyviscousfluidwitharatebelow1μLmin-1.Characteristicsandapplicationsoftheinjectorsaredescribed.
简介:O434.122006065468强脉冲软X光辐照薄塑料闪烁体发光特性研究=LinearluminescenceforthinplasticscintillatorsunderintensesoftX-rayirradiation[刊,中]/宁家敏(中物院核物理与化学研究所.四川,绵阳(621900)),蒋世伦…//强激光与粒子束.—2006,18(7).—1215-1218介绍了Z-pinch实验用软X光功率仪的测量原理,利用“强光一号”产生的强脉冲软X光对薄塑料闪烁体((?)40min×0.1mm)进行了辐照。实验中,采用两套软X光功率仪并安装在同一个大法兰面上.其中一套作为标准系统,参数保持不变,另一套系统的狭缝宽度逐渐增加,以改
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简介:最近,Brutman和Passow认为Newman类型合理插值是to|x|由对称的节点的任意的集合导致了在[-1,1]并且给了近似错误的一般评价。由他们的方法,一个人能为一些特殊节点建立近似的准确顺序。在我们考虑插值节点是第二种类型的零个Chebyshev多项式并且在这种情况中证明那的特殊情况的现在的纸,近似的准确顺序是O(1/(nlnn))。
简介:首次研究进口可利用含铜物料与进口铜矿属性的不同特性并建立了鉴定方法,采用X射线荧光光谱法和X射线衍射光谱法联用技术建立铜矿和含铜物料属性的鉴别方法。通过X射线荧光光谱法对铜矿和含铜物料中元素进行定性半定量分析,再用X射线衍射光谱法对铜矿和含铜物料的特征谱峰进行扫描,与X射线衍射仪中标准卡片比对分析,能够确定铜矿和含铜物料的物相组成。结果显示,X射线荧光光谱法测定的铜矿和含铜物料的共同特点是铜的含量较高,达到冶炼铜对原料的要求;硅、铁、钠、钙和镁元素都能够检出;差异性在铅和锌元素在含铜物料中较高,在铜矿石中基本未检出;用X射线荧光光谱法检测出的金属元素,通过X射线衍射仪扫描后与标准图片比对,各元素以不同的形式存在于含铜物料中,且有规律可循。
简介:摘要为了有效改善电力系统的供电质量水平和配电网络的管控能力,针对当前配电网电能质量监控精度低、用时长、治理方法落后、缺乏相应的辅助工具等现实问题,提出基于一体化电网电能质量数据采集平台的监控方法研究。首先分析了配电网电能质量监控的原理,介绍了智能监测系统的构成;分别提取配电系统智能监控的三个特征识别参量,即配电网电压跌落分量、系统电压的闪变分量及波动、及由于不同幅值和频率产生的正弦波分量;最后基于电力通信、智能计算机网络监控系统等技术,实现对配电网络电能质量的智能监控、全面分析和综合决策。试验证明,采用改进方法相比传统方法监控精度提高了约58.83%,具有一定的有效性。
简介:Amorerelaxedsufficientconditionfortheconvergenceoffiltered-XLMS(FXLMS)algorithmispresented.Itispointedoutthatifsomepositiverealconditionforsecondarypathtransferfunctionanditsestimatesissatisfiedwithinallthefrequencybands,FXLMSalgorithmconvergeswhateverthereferencesignalislike.Butiftheabovepositiverealconditionissatisfiedonlywithinsomefrequencybands,theconvergenceofFXLMSalgorithmisdependentonthedistributionofpowerspectraldensityofthereferencesignal,andtheconvergencestepsizeisdeterminedbythedistributionofsomespecificcorrelationmatrixeigenvalues.ApplyingtheconclusionabovetotheDelayedLMS(DLMS)algorithm,itisshownthatDLMSalgorithmwithsomeerroroftimedelayestimationconvergesincertaindiscretefrequencybands,andthewidthofwhicharedeterminedonlybythe"time-delayestimationerrorfrequency"whichisequaltoonefourthoftheinverseofestimatederrorofthetimedelay.