Rapid and nondestructive layer number identification of two-dimensional layered transition metal dichalcogenides-中国期刊网

摘要 MoS_2,MoSe_2andWSe_2thinflakeswerefabricatedbythestandardmicromechanicalcleavageprocedures.ThethicknessandtheopticalcontrastoftheatomicthindichalcogenideflakesonSiO_2/Sisubstratesweremeasuredbyatomicforcemicroscopy(AFM)andspectroscopicellipsometer.Arapidandnondestructivemethodbyusingreflectionspectrawasproposedtoidentifythelayernumberof2DlayeredtransitionmetaldichalcogenidesonSiO_2(275nm)/Sisubstrates.Thecontrastspectraof2DnanosheetswithdifferentlayernumbersareinagreementwiththeoreticalcalculationsbasedonFresnel'slaw,indicatingthatthismethodprovidesanunambiguousandnondestructivecontrastspectrafingerprintforidentifyingsingle-andfew-layeredtransitionmetaldichalcogenides.Theresultswillgreatlyhelpinfundamentalresearchandapplication.

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Rapid and nondestructive layer number identification of two-dimensional layered transition metal dichalcogenides

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Rapid and nondestructive layer number identification of two-dimensional layered transition metal dichalcogenides

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