摘要
Inthemodernanaloguedesign,TransistorLevelFaultSimulation(TLFS)playstheim-portantpartsinceeveryfaultinthewholecircuithastobesimulatedatthatlevel.Unfortunately,itisaveryCPUintensivetaskeventhoughitmaintainsthehighaccuracy.Therefore,HighLevelFaultModeling(HLFM)andHighLevelFaultSimulation(HLFS)arerequiredinordertoalleviatetheeffortsofsimulation.Inthispaper,differentHLFMapproachesarereviewedatthedevicelevelduringlasttwodecades.Weclarifytheirdomainsofapplicationandevaluatetheirstrengthsandcurrentlimitations.Wealsoanalyzecausesoffaultsandintroducevarioustestapproaches.
出版日期
2010年04月14日(中国期刊网平台首次上网日期,不代表论文的发表时间)