简介：Ensuringahighmanufacturingtestqualityofanintegratedelectroniccircuitmandatestheapplicationofalargevolumetestset.Evenifthetestdatacanbefitintothememoryofanexternaltester,theconsequentincreaseintestapplicationtimereflectsintoelevatedproductioncosts.Testdatacompressionsolutionshavebeenproposedtoaddressthetesttimeanddatavolumeproblembystoringanddeliveringthetestdatainacompressedformat,andsubsequentlybyexpandingthedataon-chip.Inthispaper,weproposeascancellpositioningmethodologythataccompaniesacompressiontechniqueinordertoboostthecompressionratio,andsquashthetestdataevenfurther.Whilewepresenttheapplicationoftheproposedapproachinconjunctionwiththefan-outbaseddecompressionarchitecture,thisapproachcanbeextendedforapplicationalongwithothercompressionsolutionsaswell.Theexperimentalresultsalsoconfirmthecompressionenhancementoftheproposedmethodology.

简介：Thegeneralconceptofdatacompressionconsistsinremovingtheredundancyexistingindatatofindamorecompactrepresentation.Thispaperisconcernedwithanewmethodofcompressionusingthesecondgenerationwaveletsbasedontheliftingscheme,whichisasimplebutpowerfulwaveletconstructionmethod.Ithasbeenprovedbyitssuccessfulapplicationtoareal-timemonitoringsystemoflargehydraulicmachinesthatitisapromisingcompressionmethod.