简介:Geepilayersofdifferentthicknessesaregrownbymolecular-beamepitaxywithSbasasurfactantonSI(100)substrates,X-raydiffractionillustratesthattheseGethinfilmsarepartiallystrained.andthestrainsdecreasegraduallywithincreasingepilayerthickness,RamanspectrarevealadownwardshiftoftheGe-Gemodepeakastheepilayerthicknessincreases.Intheregionsofhighstrain,therelationshipbetweentheRamanshiftofthismodeandthestraininthepartiallyrelaxedsamplesisconsiderablydifferentfromthelinearrelationshipreportedbefore,whichismainlyattributedtothespatialconfinementeffectofphononsinananocrystal.
简介:Moleculardynamics(MD)simulationswereperformedtoinvestigateF+continuouslybombardingSiCsurfaceswithenergiesof100eVatdifferentincidentanglesat300K.Thesimulatedresultsshowthatthesteady-stateuptakeofFatomsincreaseswithincreasingincidentangle.Withthesteady-stateetchingestablished,aSi-C-Freactivelayerisformed.ItisfoundthattheetchingyieldofSiisgreaterthanthatofC.IntheF-containingreactionlayer,theSiFspeciesisdominantwithincidentangleslessthan30o.Forallincidentangles,theCFspeciesisdominantoverCF2andCF3.
简介:GaInP/GaAs/Getriple-junctionsolarcellswereirradiatedwith50keVand100keVprotonsatfluencesof5×1010cm-2,1×1011cm-2,1×1012cm-2,and1×1013cm-2.Theirperformancedegradationisanalyzedusingcurrent-voltagecharacteristicsandspectralresponsemeasurements,andthenthechangesinIsc,Voc,Pmaxandthespectralresponseofthecellsareobservedasfunctionsofprotonirradiationfluenceandenergy.Theresultsshowthatthespectralresponseofthetopcelldegradesmoresignificantlythanthatofthemiddlecell,and100keVproton-induceddegradationratesofIsc,VocandPmaxarelargercomparedwith50keVprotonirradiation.
简介:利用电子衍射,X射线衍射和荧光光谱等方法研究了LnBaB0O16(Ln=La,Y)的结构特性,LnBaB9O16为单斜晶系,其中LaBaB9O16的晶胞参数a=1.3660nm,b=0.7882nm,c=1.6253nm,β=106.15°,YBaB9O16的晶胞参数a=1.3476nm,b=0.776nm,c=1.6040nm,β=106.38°,荧光光谱研究表明,这两种化合物结构不同,Y^3+在YBaB9O16结构中处于中心对称格位,而LaBaB9O16中La^3+的格位则无中心对称性,Gd^3+部分取代LaBaB9O16:Eu^3+中的La^3+可改善Eu^3+离子的发光性质,LaBaB9O16:Eu^3+在真空紫外区的吸收比较弱,这可能与硼氧比较小有关。
简介:ThisworkinvestigatedC2F6/O2/ArplasmachemistryanditseffectontheetchingcharacteristicsofSiCOHlow-kdielectricsin60MHz/2MHzdual-frequencycapacitivelycoupleddischarge.FortheC2F6/Arplasma,theincreaseinthelow-frequency(LF)powerledtoanincreasedionimpact,promptingthedissociationofC2F6withhigherreactionenergy.Asaresult,fluorocarbonradicalswithahighF/Cratiodecreased.Theincreaseinthedischargepressureledtoadecreaseintheelectrontemperature,resultinginthedecreaseofC2F6dissociation.FortheC2F6/O2/Arplasma,theincreaseintheLFpowerpromptedthereactionbetweenO2andC2F6,resultingintheeliminationofCF3andCF2radicals,andtheproductionofanF-richplasmaenvironment.TheF-richplasmaimprovedtheetchingcharacteristicsofSiCOHlow-kfilms,leadingtoahighetchingrateandasmoothetchedsurface.