简介:TheXRPD(X-raypowderdiffractometry)patternsofsiliconpowderwithaunitcellstructureofdiamondweredeterminedfrom298to1473K.LatticeparametersofSilinearlyincreasewithtemperature.Thethermalshiftsofthepositionsofallreflectionpeaksarelinearlycorrelatedwiththetemperature.Thecoefficientsoftheintrinsiclinearthermalexpansionandvolumetricthermalexpansionweredeterminedas3.87×10-6/Kand1.16×10-5/Krespectively.ItindicatesthatSiisstillasuitablestandardintheXRPDmethodathightemperatures.