简介：Silicondioxide(SiO2)filmswerepreparedonsapphire(α-Al2O3)byradiofrequencymagnetronreactivesputteringinordertoincreasebothtransmissionandrainerosionresistantperformanceofinfrareddomesofsapphire.CompositionandstructureofSiO2filmswereanalyzedbyX-rayphotoelectronspectroscopy(XPS)andX-raydiffraction(XRD),respectively.ThetransmittanceofuncoatedandcoatedsapphirewasmeasuredusingaFouriertransforminfrared(FTIR)spectrometer.Rainerosiontestsoftheuncoatedandcoatedsapphirewereperformedat211m/simpactvelocitywithanexposuretimerangingfrom1to8minonawhirlingarmrig.Resultsshowthatthedepositedfilmscangreatlyincreasethetransmissionofsapphireinmid-waveIR.Afterrainerosiontest,decreasesinnormalizedtransmissionwerelessthan1%fordesignedSiO2filmsandtheSiO2coatingwasstronglybondedtothesapphiresubstrate.Inaddition,sapphirescoatedwithSiO2filmshadahighertransmittancethanuncoatedonesafterrainerosion.

简介：微观结构变化的特征被XRD和TEM分析的使用与亚稳的奥氏体为钢(ZG0Cr13Mn8N)在麻蚀(CE)期间调查。结果证明标本的表面层的微观结构由α'-martensite,组成在CE前的亚稳的奥氏体和一些ε-马氏体。CE显然在表面上增加脱臼密度和直或平面的脱臼，并且导致γ->ε，ε->α'和γ->α'马氏体的转变。